Events

IEEE SPS AIVA 2021 (Artificial Intelligence for Visual Application) is a collaborative initiative going to be organzied by IEEE SPS Delhi Chapter alongwith numerous IEEE SPS Section Chapters across the IEEE India Council Region in association with IIIT Delhi, which solely aims to illuminate students regarding the latest trends in the field of Artificial Intelligence and Computer Vision. The event shall be an unprecedented compendium of webinars, hands-on workshops, networking sessions with SPS Leaders, and industrial seminars. Co-sponsored by: Indraprastha Institute of Information Technology, Delhi (IIIT-D) Agenda: The 5-day extravaganza shall enable the youth to access brand-new avenues to build their careers in the Signal Processing realm and eliminate the barriers between College academics and research-based learning skills. It shall unfold the revolutionary implications of AI in the domain of Computer Vision in a colossally interactive and systematic manner to enlighten young minds. The event also targets at enhancing the outreach and membership of Signal Processing Society and recognising researchers by means of a “Call for Poster Presentations”. Delhi, Delhi, India, Virtual: https://events.vtools.ieee.org/m/272400

With the purpose to enhance continuous learning and provide exposure to the student members by sharing their expertise, Silver Oak University IEEE Student Branch has launched a continuous learning program "CoEdunate: Together We Learn" exclusively for the SB members. Under the same program, SOU SB is organizing a workshop titled “Learn how Machine Learns” in two Parts. The complete event will be conducted by our SB members. In Part-1, the workshop will cover Python basics, Basic Data Science libraries like Pandas, NumPy, Matplotlib, and Seaborn. This workshop will help students to discover, learn, and advance in Python programming and Machine Learning with hands-on projects and interesting mind grills. Date: 26th June to 28th June 2021 Timings: 2:00 PM to 4:00 PM IST Virtual: https://events.vtools.ieee.org/m/275820